{"id":62849,"date":"2025-08-06T15:09:09","date_gmt":"2025-08-06T15:09:09","guid":{"rendered":"https:\/\/www.newsbeep.com\/us\/62849\/"},"modified":"2025-08-06T15:09:09","modified_gmt":"2025-08-06T15:09:09","slug":"holt-tests-rad-hard-1553-transceiver-to-higher-single-event-effect-levels","status":"publish","type":"post","link":"https:\/\/www.newsbeep.com\/us\/62849\/","title":{"rendered":"Holt tests rad-hard 1553 transceiver to higher single-event effect levels"},"content":{"rendered":"<p>            Product<\/p>\n<p class=\"published-date text-muted\">\n                August 06, 2025\n            <\/p>\n<p>        <img decoding=\"async\" src=\"https:\/\/www.newsbeep.com\/us\/wp-content\/uploads\/2025\/08\/1754485214.png\" class=\"primary-image\" width=\"320\" alt=\"Holt tests rad-hard 1553 transceiver to higher single-event effect levels\" loading=\"lazy\"\/><\/p>\n<p>ALISO VIEJO, Calif. Holt Integrated Circuits announced it has tested its recently released\u00a0HI-1592, a radiation-hardened 3.3V\u00a0MIL-STD-1553 dual transceiver\u00a0designed for high reliability and space applications, to higher single-event effects (SEE) levels.<\/p>\n<p>SEE levels collectively include single-event transient (SET), single-event functional interrupt (SEFI), single event latch-up (SEL), and single event burnout (SEB) &#8212; all of these states can cause temporary or permanent damage to electronic components as a result of heavy ion or proton impact.\u00a0<\/p>\n<p>The HI-1592, say Holt officials, is immune to latch-up and was proven to during the tests to withstand a single-event upset (SEU) with a linear energy transfer (LET) of at least 86.3 MeV-cm2\/mg (previously tested to 67.7 MeV-cm2\/ mg). The device is radiation-tolerant to a total ionizing dose (TID) of 100 krad(Si). The higher LET rating demonstrates additional robustness for use in launch vehicle, high-altitude aircraft, or space applications utilizing MIL-STD-1553 data bus communication. Testing was performed by Holt in association with Zero-G Radiation Assurance at Texas A &amp; M University.\u00a0<\/p>\n<p style=\"margin-bottom:11px\">\u201cDemonstrating higher SEE capability provides our customers with additional confidence to use Holt\u2019s rad-hard MIL-STD-1553 transceiver in the demanding high-altitude and space environments,\u201d said Anthony Murray, Director of Marketing Communications at Holt Integrated Circuits.<\/p>\n<p style=\"margin-bottom:11px\">The HI-1592 is available in a hermetic 24-pin ceramic SOIC. The device is offered in an extended -55\u00a0oC to +125\u00a0oC temperature range, with the option of burn-in, 100% PIND testing, and compliance with MIL-PRF-38535 QML class Q.<\/p>\n<p style=\"margin-bottom:11px\">To request information on Holt\u2019s ARINC 429, Discrete-to-Digital\/Driver, MIL-STD-1553 and other product lines, readers should contact Holt at (949) 859-8800, by e-mail\u00a0at\u00a0<a href=\"http:\/\/militaryembedded.com\/cdn-cgi\/l\/email-protection#1b72757d745b7374776f727835787476\" style=\"color:#467886; text-decoration:underline\" title=\"mailto:info@holtic.com\" rel=\"nofollow noopener\" target=\"_blank\">[email\u00a0protected]<\/a>, or visit the Holt website at\u00a0<a href=\"http:\/\/www.holtic.com\/\" style=\"color:#467886; text-decoration:underline\" target=\"_blank\" title=\"http:\/\/www.holtic.com\" rel=\"nofollow noopener\">www.holtic.com<\/a>.<\/p>\n<p>\u00a0<\/p>\n<p>\u00a0&#13;\n<\/p>\n<p>\u00a0<\/p>\n<p>\n        Featured Companies\n        <\/p>\n<p>                                <a href=\"https:\/\/militaryembedded.com\/company\/holt-integrated-circuits\" rel=\"nofollow noopener\" target=\"_blank\"><br \/>\n                    <img decoding=\"async\" src=\"https:\/\/www.newsbeep.com\/us\/wp-content\/uploads\/2025\/08\/logos1694549637.jpg\" class=\"img-fluid\"\/><br \/>\n                <\/a><\/p>\n","protected":false},"excerpt":{"rendered":"Product August 06, 2025 ALISO VIEJO, Calif. Holt Integrated Circuits announced it has tested its recently released\u00a0HI-1592, a&hellip;\n","protected":false},"author":2,"featured_media":62850,"comment_status":"","ping_status":"","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[46],"tags":[191,74],"class_list":{"0":"post-62849","1":"post","2":"type-post","3":"status-publish","4":"format-standard","5":"has-post-thumbnail","7":"category-computing","8":"tag-computing","9":"tag-technology"},"_links":{"self":[{"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/posts\/62849","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/comments?post=62849"}],"version-history":[{"count":0,"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/posts\/62849\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/media\/62850"}],"wp:attachment":[{"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/media?parent=62849"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/categories?post=62849"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.newsbeep.com\/us\/wp-json\/wp\/v2\/tags?post=62849"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}